ファイル種別: application/pdf
全ての絞り込みを解除

1653 件のレコードが見つかりました。 1631件目から1640件目まで表示します。

全ての絞り込みを解除
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
HfO2-Fig6-Work-20230118.pdf
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
HfO2-Fig7-Work-20221213.pdf
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900
HfO2-Fig8-Work-20220304-2.pdf
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:11:29 +0900
Experimental_Study_on_the_Critical_Current_Properties_of_Flexible_Nb3Al_Superconducting_Wires_in_Cryocooler_System (final draft).pdf
Experimental Study on the Critical Current Properties of Flexible Nb3Al Superconducting Wires in Cryocooler System
ジャーナル論文
著者
Hibiki Fukuda (author) (この著者で検索)
Okayama University
ORCID ;
Riku Onoue (author) (この著者で検索)
Okayama University
;
Tomoya Sakamoto (author) (この著者で検索)
Okayama University
;
Ryota Inoue (author) (この著者で検索)
Okayama University
ORCID ;
Hiroshi Ueda (author) (この著者で検索)
Okayama University
ORCID ;
SeokBeom Kim (author) (この著者で検索)
Okayama University
ORCID ;
Akihiro Kikuchi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Yasuo Iijima (author) (この著者で検索)
National Institute for Materials Science
キーワード
Nb3Al, Superconducting wire, Cryocooler
刊行年月日
2023-03-20
更新時刻
2024-01-30 09:30:14 +0900
2026matertodaycomm_watanabe.pdf
Computational micromechanics of ductile fracture in duplex periodic microstructures
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI
キーワード
Ductile fracture, Constituent connectivity, Computational micromechanics, Duplex microstructures, Plasticity-induced damage, Finite element analysis
刊行年月日
2026-08-28
更新時刻
2026-09-02 11:31:53 +0900
Final version.pdf
Characteristic deformation microstructure evolution and deformation mechanisms in face-centered cubic high/medium entropy alloys
ジャーナル論文
著者
Shuhei Yoshida (author) (この著者で検索)
;
Rui Fu (author) (この著者で検索)
;
Wu Gong (author) (この著者で検索)
;
Takuto Ikeuchi (author) (この著者で検索)
;
Yu Bai (author) (この著者で検索)
;
Zongqiang Feng (author) (この著者で検索)
;
Guilin Wu (author) (この著者で検索)
;
Akinobu Shibata (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Niels Hansen (author) (この著者で検索)
;
Xiaoxu Huang (author) (この著者で検索)
;
Nobuhiro Tsuji (author) (この著者で検索)
キーワード
High/medium entropy alloys, Dislocation structure, Deformation twinning, Strain hardening, 3D characterization
刊行年月日
2024-10-21
更新時刻
2025-12-11 12:30:12 +0900
絞り込み