Oxygen Defects and Instability in Very Thin a‐IGZO TFTs

Article

Creator

Hanjun Cho ; Masatake Tsuji ; Shigenori Ueda ; Junghwan Kim ; Hideo Hosono

Keyword

a-IGZO, TFT, Oxygen defects, positive-bias-stress instability

Date published

2025-07-07

Updated at

2025-09-24 12:30:21 +0900