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Article(4)
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Bayesian estimation (4)
X-ray photoelectron spectroscopy (3)
Exchange Monte Carlo method (2)
SESSA (2)
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Feature selection (1)
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Silicon surface oxidation (1)
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Keyword: Bayesian estimation
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4 records found.
Bayesian inference for peak feature extraction and prediction of material property in X-ray diffraction data
Article
Creator
Ryo Murakami
;
Taisuke T. Sasaki
;
Hideki Yoshikawa
;
Yoshitaka Matsushita
;
Keitaro Sodeyama
;
Tadakatsu Ohkubo
;
Hiroshi Shinotsuka
;
Kenji Nagata
Keyword
Materials informatics
,
Spectral decomposition
,
Bayesian estimation
,
Feature selection
,
AI-ready
Date published
2024-12-31
Updated at
2025-11-10 16:30:53 +0900
Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data
Article
Creator
Atsushi Machida ;
Kenji Nagata
;
Ryo Murakami
;
Hiroshi Shinotsuka
; Hayaru Shouno ;
Hideki Yoshikawa
; Masato Okada
Keyword
X-ray photoelectron spectroscopy
,
Bayesian estimation
,
Exchange Monte Carlo method
,
SESSA
Date published
2024-05-29
Updated at
2025-11-10 12:30:27 +0900
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
Article
Creator
Hiroshi Shinotsuka
;
Kenji Nagata
;
Hideki Yoshikawa
; Shuichi Ogawa ; Akitaka Yoshigoe
Keyword
Bayesian estimation
,
X-ray photoelectron spectroscopy
,
Statistical analysis
,
Silicon surface oxidation
Date published
2024-12-03
Updated at
2025-01-21 12:30:34 +0900
Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator
Article
Creator
Hiroshi Shinotsuka
;
Kenji Nagata
; Malinda Siriwardana ;
Hideki Yoshikawa
;
Hayaru Shouno
;
Masato Okada
Keyword
X-ray photoelectron spectroscopy
,
Bayesian estimation
,
Exchange Monte Carlo method
,
SESSA
Date published
2023-07-06
Updated at
2024-01-05 22:11:57 +0900
Keyword
Bayesian estimation
(4)
X-ray photoelectron spectroscopy
(3)
Exchange Monte Carlo method
(2)
SESSA
(2)
AI-ready
(1)
Feature selection
(1)
Materials informatics
(1)
Silicon surface oxidation
(1)
Spectral decomposition
(1)
Statistical analysis
(1)
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