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Ultrathin specimen preparation by a low energy Ar ion milling method
Article
Creator
Masanori Mitome SAMURAI ORCID
Keyword
Ar-ion milling, sample preparation, ultrathin specimen, low-energy ion beam, gamma-Ga2O3, (Zn, Cr) Te
Date published
2012-11-14
Updated at
2024-03-05 08:30:19 +0900