File type: application/pdf Keyword: Al2O3
Reset all filters

3 records found. Displaying records 1 to 3.

Reset all filters
Nabatame_d-SiO2-Ga2O3 2026_ECS_J._Solid_State_Sci._Technol._15_064005.pdf
Characteristics of β-Ga2O3/Al2O3/Pt capacitors with a Ga2O3 surface modified using the dummy-SiO2 process
Journal article
Creator
Toshihide Nabatame (author) (Search by this author)
Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science
ORCID SAMURAI ;
Yoshihiro Irokawa (author) (Search by this author)
Research Center for Electronic and Optical Materials/Functional Materials Field/Ultra-wide Bandgap Semiconductors Group, National Institute for Materials Science
ORCID SAMURAI ;
Tomomi Sawada (author) (Search by this author)
Research Center for Materials Nanoarchitectonics (MANA)/Semiconductor Materials Field/Thin Film Electronics Group, National Institute for Materials Science
;
Hiromi Miura (author) (Search by this author)
Research Center for Materials Nanoarchitectonics (MANA)/Semiconductor Materials Field/Thin Film Electronics Group, National Institute for Materials Science
;
Manami Miyamoto (author) (Search by this author)
Research Center for Materials Nanoarchitectonics (MANA)/Semiconductor Materials Field/Thin Film Electronics Group, National Institute for Materials Science
;
Takashi Onaya (author) (Search by this author)
Research Center for Materials Nanoarchitectonics (MANA)/Semiconductor Materials Field/Thin Film Electronics Group, National Institute for Materials Science
ORCID ;
Yasuo Koide (author) (Search by this author)
Research Center for Electronic and Optical Materials/Functional Materials Field/Next-generation Semiconductor Group, National Institute for Materials Science
ORCID SAMURAI ;
Kazuhito Tsukagoshi (author) (Search by this author)
Research Center for Materials Nanoarchitectonics (MANA)/Semiconductor Materials Field/Thin Film Electronics Group, National Institute for Materials Science
ORCID SAMURAI
Keyword
Ga2O3, atomic layer deposition, dummy-SiO2, Al2O3, positive bias stress
Date published
2026-06-01
Updated at
2026-08-18 11:30:17 +0900
NIMS_MDR.pdf
Direct Analysis of Stacked Au/Ti/In2O3/Al2O3/p+-Si Transport Mechanisms Using Operando Hard X-ray Photoelectron Spectroscopy
Journal article
Creator
Ibrahima Gueye (author) (Search by this author)
National Institute for Materials Science
ORCID ;
Shigenori Ueda (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Atsushi Ogura (author) (Search by this author)
;
Takahiro Nagata (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
Operando, HAXPES, Interfaces, In2O3, Al2O3, Band bending, Chemical-structures
Date published
2024-05-28
Updated at
2025-05-15 08:30:10 +0900
[Vol. 53]A New Way to Observe Heat Flows at Nanoscale_ WPI-MANA.pdf
[Research Highlights Vol.53] A New Way to Observe Heat Flows at Nanoscale
Magazine
Collection
Research Highlights
Creator
International Center for Materials Nanoarchitectonics (WPI-MANA) (author) (Search by this author)
National Institute for Materials Science
Keyword
Thermal conductivity, transmission electron microscopy, electron beam, heatsink composite, heat pathway, nanoscale measurement, STAM, epoxy, almina, Al2O3, constantan
Date published
2019-11-12
Updated at
2023-12-25 00:30:24 +0900
Filter