International Standardization of Terminology, Sample Handling and Data Transfer Format for Scanning Probe Microscopy

ジャーナル論文

著者

Keiko ONISHI (author) (この著者で検索)

https://orcid.org/0000-0003-3979-8905

NIMS Researchers Directory SAMURAI

Keiko ONISHI

キーワード

scanning probe microscopy, international standardization, terminology, sample handling, data management

刊行年月日

2025-01-10

更新時刻

2025-04-03 08:30:13 +0900