International Standardization of Terminology, Sample Handling and Data Transfer Format for Scanning Probe Microscopy

Journal article

Creator

Keiko ONISHI (author) (Search by this author)

https://orcid.org/0000-0003-3979-8905

NIMS Researchers Directory SAMURAI

Keiko ONISHI

Keyword

scanning probe microscopy, international standardization, terminology, sample handling, data management

Date published

2025-01-10

Updated at

2025-04-03 08:30:13 +0900