Study of Local Band Bending in n-Channel In2O3 Thin-Film Transistors under Gate and Drain Voltage Stress Using Operando Hard X-ray Photoelectron Spectroscopy
- Journal article
- Creator
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Ibrahima Gueye (author) (Search by this author)
https://orcid.org/0000-0001-5296-3894
(unauthenticated)
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;Akira Yasui (author) (Search by this author)Yasumasa Takagi (author) (Search by this author)
https://orcid.org/0000-0001-8064-3345
(unauthenticated)
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;Atsushi Ogura (author) (Search by this author)Osami Sakata (author) (Search by this author)
https://orcid.org/0000-0003-2626-0161
(unauthenticated)
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Takahiro Nagata (author) (Search by this author)
- Keyword
- hard X-ray photoelectron spectroscopy, Indium oxide, operando, oxide thin-film transistor, oxide semiconductor
- Date published
- 2025-09-24
- Updated at
- 2026-04-30 12:01:11 +0900
Electron trapping/detrapping at oxygen vacancies and imprint evolution in La-doped Hf0.5Zr0.5O2 ferroelectric capacitors probed by hard x-ray photoelectron spectroscopy
- Journal article
- Creator
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W. Hamouda (author) (Search by this author)
https://orcid.org/0000-0002-7055-7264
(unauthenticated)
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Y. Yamashita (author) (Search by this author)
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S. Ueda (author) (Search by this author)
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S. Matzen (author) (Search by this author)
https://orcid.org/0000-0002-4244-6516
(unauthenticated)
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O. Renault (author) (Search by this author)
https://orcid.org/0000-0002-0683-9590
(unauthenticated)
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F. Mehmood (author) (Search by this author)
https://orcid.org/0000-0002-9530-380X
(unauthenticated)
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T. Mikolajick (author) (Search by this author)
https://orcid.org/0000-0003-3814-0378
(unauthenticated)
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U. Schroeder (author) (Search by this author)
https://orcid.org/0000-0002-6824-2386
(unauthenticated)
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N. Barrett (author) (Search by this author)
https://orcid.org/0000-0002-8228-0805
(unauthenticated)
- Keyword
- Hf0.5Zr0.5O2, HAXPES, operando
- Date published
- 2025-11-03
- Updated at
- 2025-11-13 12:30:12 +0900