Overestimation of Operational Stability in Polymer-Based Organic Field-Effect Transistors Caused by Contact Resistance

Journal article

Creator

Kenji Sakamoto (author) (Search by this author)

https://orcid.org/0000-0002-1379-874X

National Institute for Materials Science

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Kenji Sakamoto ;

Takeshi Yasuda (author) (Search by this author)

https://orcid.org/0000-0003-4652-9105

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Takeshi Yasuda ;

Takeo Minari (author) (Search by this author)

https://orcid.org/0000-0001-7690-221X

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Takeo Minari ;

Masafumi Yoshio (author) (Search by this author)

https://orcid.org/0000-0002-1442-4352

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Masafumi Yoshio ;

Junpei Kuwabara (author) (Search by this author)

https://orcid.org/0000-0002-9032-5655 (unauthenticated)

Junpei Kuwabara ;

Masayuki Takeuchi (author) (Search by this author)

https://orcid.org/0000-0002-0207-0665

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Masayuki Takeuchi

Keyword

polymer-based organic field-effect transistors, bias-stress effects, contact resistance, modified transmission line method, operational stability

Date published

2024-12-11

Updated at

2025-12-04 16:39:15 +0900