2 records found.
Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors
- Journal article
- Creator
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;Yi-Te Lee (author) (Search by this author);Yu-Ting Huang (author) (Search by this author);Shao-Pin Chiu (author) (Search by this author);Ruey-Tay Wang (author) (Search by this author)Takashi Taniguchi (author) (Search by this author)National Institute for Materials Science
;
Kenji Watanabe (author) (Search by this author)National Institute for Materials Science
;
;Raman Sankar (author) (Search by this author);Chi-Te Liang (author) (Search by this author);Wei-Hua Wang (author) (Search by this author);Sheng-Shiuan Yeh (author) (Search by this author)Juhn-Jong Lin (author) (Search by this author) - Keyword
- electron scattering, 2D materials, Coulomb scattering strength, low-frequency noise, indium selenide, interfacial Coulomb scatterers, 2D transist
- Date published
- 2024-01-10
- Updated at
- 2025-10-21 15:50:45 +0900
[Research Highlights Vol.87]MANA Scientists Usher in Advances in Thermoelectric Materials
- Magazine
- Collection
- Research Highlights
- Creator
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International Center for Materials Nanoarchitectonics (WPI-MANA) (author) (Search by this author)National Institute for Materials Science
- Keyword
- thermoelectric, grain boundary, segregation, electron scattering, weighted mobility, thermal conductivity, conversion efficiency
- Date published
- 2024-02-16
- Updated at
- 2024-08-06 16:30:43 +0900