Dielectric permittivity, conductivity and breakdown field of hexagonal boron nitride

Journal article

Creator

A Pierret (author) (Search by this author)

A Pierret ;

D Mele (author) (Search by this author)

D Mele ;

H Graef (author) (Search by this author)

H Graef ;

J Palomo (author) (Search by this author)

J Palomo ;

T Taniguchi (author) (Search by this author)

https://orcid.org/0000-0002-1467-3105

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

T Taniguchi ;

K Watanabe (author) (Search by this author)

https://orcid.org/0000-0003-3701-8119

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

K Watanabe ;

Y Li (author) (Search by this author)

Y Li ;

B Toury (author) (Search by this author)

B Toury ;

C Journet (author) (Search by this author)

C Journet ;

P Steyer (author) (Search by this author)

P Steyer ;

V Garnier (author) (Search by this author)

V Garnier ;

A Loiseau (author) (Search by this author)

A Loiseau ;

J-M Berroir (author) (Search by this author)

J-M Berroir ;

E Bocquillon (author) (Search by this author)

E Bocquillon ;

G Fève (author) (Search by this author)

G Fève ;

C Voisin (author) (Search by this author)

C Voisin ;

E Baudin (author) (Search by this author)

E Baudin ;

M Rosticher (author) (Search by this author)

M Rosticher ;

B Plaçais (author) (Search by this author)

B Plaçais

Keyword

Hexagonal boron nitride, dielectric characterization, trap-assisted electron transport

Date published

2022-06-01

Updated at

2025-02-26 12:30:49 +0900