Raman spectroscopy as probe of nanometre-scale strain variations in graphene

Journal article

Creator

C. Neumann (author) (Search by this author)

C. Neumann ;

S. Reichardt (author) (Search by this author)

S. Reichardt ;

P. Venezuela (author) (Search by this author)

P. Venezuela ;

M. Drögeler (author) (Search by this author)

M. Drögeler ;

L. Banszerus (author) (Search by this author)

L. Banszerus ;

M. Schmitz (author) (Search by this author)

M. Schmitz ;

K. Watanabe (author) (Search by this author)

https://orcid.org/0000-0003-3701-8119

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

K. Watanabe ;

T. Taniguchi (author) (Search by this author)

https://orcid.org/0000-0002-1467-3105

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

T. Taniguchi ;

F. Mauri (author) (Search by this author)

F. Mauri ;

B. Beschoten (author) (Search by this author)

B. Beschoten ;

S. V. Rotkin (author) (Search by this author)

S. V. Rotkin ;

C. Stampfer (author) (Search by this author)

C. Stampfer

Keyword

Confocal Raman spectroscopy, graphene, crystalline quality

Date published

2015-09-29

Updated at

2025-02-27 12:30:10 +0900