Raman spectroscopy as probe of nanometre-scale strain variations in graphene

C. Neumann; S. Reichardt; P. Venezuela; M. Drögeler; L. Banszerus; M. Schmitz; K. Watanabe; T. Taniguchi; F. Mauri; B. Beschoten; S. V. Rotkin; C. Stampfer

doi:10.1038/ncomms9429

論文 Raman spectroscopy as probe of nanometre-scale strain variations in graphene

C. Neumann ; S. Reichardt ; P. Venezuela ; M. Drögeler ; L. Banszerus ; M. Schmitz ; K. Watanabe (National Institute for Materials Science) ; T. Taniguchi (National Institute for Materials Science) ; F. Mauri ; B. Beschoten ; S. V. Rotkin ; C. Stampfer

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C. Neumann, S. Reichardt, P. Venezuela, M. Drögeler, L. Banszerus, M. Schmitz, K. Watanabe, T. Taniguchi, F. Mauri, B. Beschoten, S. V. Rotkin, C. Stampfer. Raman spectroscopy as probe of nanometre-scale strain variations in graphene. Nature Communications. 2015, 6 (1), 8429. https://doi.org/10.1038/ncomms9429

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(abstract)

Confocal Raman spectroscopy is a versatile, non-invasive investigation tool and a major workhorse for graphene characterization. Here we show that the experimentally observed Raman 2D line width is a measure of nanometer-scale strain variations in graphene. By investigating the relation between the G and 2D line at high magnetic fields we find that the 2D line width contains valuable information on nanometer-scale flatness and lattice deformations of graphene, making it a good quantity for classifying the structural quality of graphene even at zero magnetic field.

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