C. Neumann
;
S. Reichardt
;
P. Venezuela
;
M. Drögeler
;
L. Banszerus
;
M. Schmitz
;
K. Watanabe
(National Institute for Materials Science)
;
T. Taniguchi
(National Institute for Materials Science)
;
F. Mauri
;
B. Beschoten
;
S. V. Rotkin
;
C. Stampfer
Description:
(abstract)Confocal Raman spectroscopy is a versatile, non-invasive investigation tool and a major workhorse for graphene characterization. Here we show that the experimentally observed Raman 2D line width is a measure of nanometer-scale strain variations in graphene. By investigating the relation between the G and 2D line at high magnetic fields we find that the 2D line width contains valuable information on nanometer-scale flatness and lattice deformations of graphene, making it a good quantity for classifying the structural quality of graphene even at zero magnetic field.
Rights:
Keyword: Confocal Raman spectroscopy, graphene, crystalline quality
Date published: 2015-09-29
Publisher: Springer Science and Business Media LLC
Journal:
Funding:
Manuscript type: Publisher's version (Version of record)
MDR DOI:
First published URL: https://doi.org/10.1038/ncomms9429
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Other identifier(s):
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Updated at: 2025-02-27 12:30:10 +0900
Published on MDR: 2025-02-27 12:30:11 +0900
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