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Bi2 Sr2 CaCu2 O8 (1)
Josephson junction (1)
annealing condition (1)
high-temperature superconductor (1)
terahertz emitter (1)
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Keyword: annealing condition
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Study of device characteristics of intrinsic Josephson junction terahertz emitters related to annealing conditions of the crystals
Journal article
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S. Nakagawa
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https://orcid.org/0000-0003-4539-6953
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S. Nakagawa
;
T. Shizu
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T. Shizu
;
T. Imai
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T. Imai
;
M. Nakayama
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M. Nakayama
;
J. Kim
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J. Kim
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H. Minami
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https://orcid.org/0000-0003-4884-3560
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H. Minami
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K. Kadowaki
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https://orcid.org/0000-0001-9391-1150
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K. Kadowaki
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M. Tsujimoto
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https://orcid.org/0000-0003-4296-5137
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M. Tsujimoto
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H. Nakao
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https://orcid.org/0000-0003-4020-537X
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H. Nakao
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H. Eisaki
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https://orcid.org/0000-0002-8299-6416
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H. Eisaki
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S. Ishida
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https://orcid.org/0000-0001-9445-8079
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S. Ishida
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T. Mochiku
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https://orcid.org/0000-0003-2208-4279
National Institute for Materials Science
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T. Mochiku
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Y. Hasegawa
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https://orcid.org/0000-0002-6674-4745
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Y. Hasegawa
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T. Kashiwagi
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https://orcid.org/0000-0002-4839-9247
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T. Kashiwagi
Keyword
Josephson junction
,
terahertz emitter
,
high-temperature superconductor
,
annealing condition
,
Bi2 Sr2 CaCu2 O8
Date published
2023-04-28
Updated at
2024-11-12 11:51:15 +0900
Keyword
Bi2 Sr2 CaCu2 O8
(1)
Josephson junction
(1)
annealing condition
(1)
high-temperature superconductor
(1)
terahertz emitter
(1)
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