Temperature- and depth-dependent valence band electronic structures of half-metallic ${\mathrm{Co}}_2\mathrm{MnSi}$ studied by hard x-ray photoemission spectroscopy

Journal article

Creator

Shigenori Ueda (author) (Search by this author)

https://orcid.org/0000-0001-9425-0614

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Shigenori Ueda ;

Yuichi Fujita (author) (Search by this author)

https://orcid.org/0000-0002-1798-1066

Yuichi Fujita ;

Ivan Kurniawan (author) (Search by this author)

https://orcid.org/0000-0001-5419-0047

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Ivan Kurniawan ;

Yuya Sakuraba (author) (Search by this author)

https://orcid.org/0000-0003-4618-9550

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Yuya Sakuraba ;

Yoshio Miura (author) (Search by this author)

https://orcid.org/0000-0002-5605-5452

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Yoshio Miura

Keyword

Co2MnSi, HAXPES, Temperature dependence, Interface and bulk electronic states, interface and bulk magnetic properties, X-ray polarization dependence

Date published

2026-02-18

Updated at

2026-02-21 08:30:04 +0900