Keyword: Spectroscopic ellipsometry
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2 records found.

acsnano.2c12773.pdf
Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry
Journal article
Creator
Ralfy Kenaz (author) (Search by this author)
;
Saptarshi Ghosh (author) (Search by this author)
;
Pradheesh Ramachandran (author) (Search by this author)
;
Kenji Watanabe (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Takashi Taniguchi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Hadar Steinberg (author) (Search by this author)
;
Ronen Rapaport (author) (Search by this author)
Keyword
Spectroscopic ellipsometry, thickness mapping, transition metal dichalcogenides
Date published
2023-05-23
Updated at
2025-02-14 12:30:58 +0900
Dataset
Optical constants of MgxZn1-xO
Dataset
Creator
Yusuke Kozuka (author) (Search by this author)
Research Center for Materials Nanoarchitectonics, National Institute for Materials Science
ORCID SAMURAI
Keyword
Optical constants, Spectroscopic ellipsometry, Zinc oxide
Date published
2025-04-06
Updated at
2025-04-08 11:27:45 +0900