Rapid measurement of low-order aberrations using Fourier transforms of crystalline Ronchigrams

Journal article

Creator

Koji Kimoto (author) (Search by this author)

https://orcid.org/0000-0002-3927-0492

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Koji Kimoto ;

Kazuo Ishizuka (author) (Search by this author)

HREM Research (Japan)

Kazuo Ishizuka

Keyword

STEM, alignment, Ronchigram, Aberration

Date published

2017-03-18

Updated at

2024-01-05 22:13:14 +0900