High-Fidelity Phase-Field Simulation of Solid-State Sintering Enabled by Bayesian Data Assimilation Using In Situ Electron Tomography Data
- Journal article
- Creator
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Akimitsu Ishii (author) (Search by this author)National Institute for Materials Science
;
;Akinori Yamanaka (author) (Search by this author);Mizumo Yoshinaga (author) (Search by this author);Shunsuke Sato (author) (Search by this author);Midori Ikeuchi (author) (Search by this author);Hikaru Saito (author) (Search by this author);Satoshi Hata (author) (Search by this author)Akiyasu Yamamoto (author) (Search by this author) - Keyword
- Bayesian data assimilation, In situ, Phase-field simulation, Sintering, Nanoparticles
- Date published
- 2024-08-02
- Updated at
- 2026-08-27 16:18:14 +0900
In situ nanobeam x-ray diffraction of local strain in AlGaN/GaN high-electron-mobility transistors under operating condition
- Journal article
- Creator
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;Akihiro Shimada (author) (Search by this author);Haruna Shiomi (author) (Search by this author)Tetsuya Tohei (author) (Search by this author)
https://orcid.org/0000-0002-4113-2566
(unauthenticated)
;
Yusuke Hayashi (author) (Search by this author)
;
;Masaya Yamaguchi (author) (Search by this author)Junpei Yamamoto (author) (Search by this author)
https://orcid.org/0009-0007-5684-0569
(unauthenticated)
;
Takeaki Hamachi (author) (Search by this author)
https://orcid.org/0000-0002-0631-1729
(unauthenticated)
;
Yasuhiko Imai (author) (Search by this author)
https://orcid.org/0000-0003-4686-2629
(unauthenticated)
;
;Kazushi Sumitani (author) (Search by this author)Shigeru Kimura (author) (Search by this author)
https://orcid.org/0000-0003-1064-7572
(unauthenticated)
;
Shota Kaneki (author) (Search by this author)
https://orcid.org/0000-0003-0806-8571
(unauthenticated)
;
Tamotsu Hashizume (author) (Search by this author)
https://orcid.org/0009-0004-8229-9460
(unauthenticated)
;
Akira Sakai (author) (Search by this author)
https://orcid.org/0000-0002-0654-504X
(unauthenticated)
- Keyword
- GaN, HEMT, Strain, In situ
- Date published
- 2025-08-21
- Updated at
- 2025-08-23 08:30:23 +0900