Influence of Fermi level pinning on contact potential difference measurements using Kelvin probe force microscopy

Journal article

Creator

Nobuyuki Ishida (author) (Search by this author)

https://orcid.org/0000-0003-0161-0583

NIMS Researchers Directory SAMURAI

Nobuyuki Ishida

Keyword

Kelvin probe force microscopy, Simulation, Electrostatic force, Fermi level pinning

Date published

2025-03-07

Updated at

2025-03-10 16:30:14 +0900