Breakdown of the Static Dielectric Screening Approximation of Coulomb Interactions in Atomically Thin Semiconductors

Journal article

Creator

Amine Ben Mhenni (author) (Search by this author)

Amine Ben Mhenni ;

Dinh Van Tuan (author) (Search by this author)

Dinh Van Tuan ;

Leonard Geilen (author) (Search by this author)

Leonard Geilen ;

Marko M. Petrić (author) (Search by this author)

Marko M. Petrić ;

Melike Erdi (author) (Search by this author)

Melike Erdi ;

Kenji Watanabe (author) (Search by this author)

https://orcid.org/0000-0003-3701-8119

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Kenji Watanabe ;

Takashi Taniguchi (author) (Search by this author)

https://orcid.org/0000-0002-1467-3105

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Takashi Taniguchi ;

Seth Ariel Tongay (author) (Search by this author)

Seth Ariel Tongay ;

Kai Müller (author) (Search by this author)

Kai Müller ;

Nathan P. Wilson (author) (Search by this author)

Nathan P. Wilson ;

Jonathan J. Finley (author) (Search by this author)

Jonathan J. Finley ;

Hanan Dery (author) (Search by this author)

Hanan Dery ;

Matteo Barbone (author) (Search by this author)

Matteo Barbone

Keyword

dielectric screening, Coulomb interactions
, atomically thin semiconductors


Date published

2025-02-04

Updated at

2026-02-16 17:15:39 +0900