Keyword: 2D transist
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2024A00062G_Manuscript_Determining the electron scattering from interfacial Coulomb scatterers in two-dimensional transistors.pdf
Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors
Journal article
Creator
Yi-Te Lee (author) (Search by this author)
;
Yu-Ting Huang (author) (Search by this author)
;
Shao-Pin Chiu (author) (Search by this author)
;
Ruey-Tay Wang (author) (Search by this author)
;
Takashi Taniguchi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kenji Watanabe (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Raman Sankar (author) (Search by this author)
;
Chi-Te Liang (author) (Search by this author)
;
Wei-Hua Wang (author) (Search by this author)
;
Sheng-Shiuan Yeh (author) (Search by this author)
;
Juhn-Jong Lin (author) (Search by this author)
Keyword
electron scattering, 2D materials, Coulomb scattering strength, low-frequency noise, indium selenide, interfacial Coulomb scatterers, 2D transist
Date published
2024-01-10
Updated at
2025-10-21 15:50:45 +0900