Measurement method: x-ray photoelectron spectroscopy

1 record found.

Dataset
XPS spectral data for p- and n-type Si wafers with various resistivities acquired at SPring-8 BL15
Dataset
Creator
SUMIYA, Masatomo (author) (Search by this author)
ORCID SAMURAI
Keyword
XPS, SPring-8 BL15, Si
Date published
Updated at
2024-05-24 08:30:24 +0900