資源タイプ: ジャーナル論文 キーワード: Bayesian estimation
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Bayesian inference for peak feature extraction and prediction of material property in X-ray diffraction data.pdf
Bayesian inference for peak feature extraction and prediction of material property in X-ray diffraction data
ジャーナル論文
著者
Ryo Murakami (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Taisuke T. Sasaki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Hideki Yoshikawa (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Yoshitaka Matsushita (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Keitaro Sodeyama (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Hiroshi Shinotsuka (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kenji Nagata (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Materials informatics, Spectral decomposition, Bayesian estimation, Feature selection, AI-ready
刊行年月日
2024-12-31
更新時刻
2025-11-10 16:30:53 +0900
2024_Machida_JES_273_147499.pdf
Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data
ジャーナル論文
著者
Atsushi Machida (author) (この著者で検索)
;
Kenji Nagata (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Ryo Murakami (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Hiroshi Shinotsuka (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Hayaru Shouno (author) (この著者で検索)
;
Hideki Yoshikawa (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Masato Okada (author) (この著者で検索)
キーワード
X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA
刊行年月日
2024-05-29
更新時刻
2025-11-10 12:30:27 +0900
Shinotsuka2024_ApplSurfSci685_162001.pdf
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
ジャーナル論文
著者
Hiroshi Shinotsuka (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kenji Nagata (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Hideki Yoshikawa (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Shuichi Ogawa (author) (この著者で検索)
;
Akitaka Yoshigoe (author) (この著者で検索)
キーワード
Bayesian estimation, X-ray photoelectron spectroscopy, Statistical analysis, Silicon surface oxidation
刊行年月日
2024-12-03
更新時刻
2025-01-21 12:30:34 +0900
Shinotsuka2023_JES267_147370.pdf
Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator
ジャーナル論文
著者
Hiroshi Shinotsuka (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
ORCID SAMURAI ;
Kenji Nagata (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
ORCID SAMURAI ;
Malinda Siriwardana (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
;
Hideki Yoshikawa (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
ORCID SAMURAI ;
Hayaru Shouno (author) (この著者で検索)
The University of Electro-Communications Graduate School of Informatics and Engineering
ORCID ;
Masato Okada (author) (この著者で検索)
The University of Tokyo Graduate School of Frontier Science
ORCID
キーワード
X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA
刊行年月日
2023-07-06
更新時刻
2024-01-05 22:11:57 +0900