4 records found.
Bayesian inference for peak feature extraction and prediction of material property in X-ray diffraction data
- Journal article
- Creator
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Ryo Murakami (author) (Search by this author)National Institute for Materials Science
;
Taisuke T. Sasaki (author) (Search by this author)National Institute for Materials Science
;
Hideki Yoshikawa (author) (Search by this author)National Institute for Materials Science
;
Yoshitaka Matsushita (author) (Search by this author)National Institute for Materials Science
;
Keitaro Sodeyama (author) (Search by this author)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
Hiroshi Shinotsuka (author) (Search by this author)National Institute for Materials Science
;
Kenji Nagata (author) (Search by this author)National Institute for Materials Science
- Keyword
- Materials informatics, Spectral decomposition, Bayesian estimation, Feature selection, AI-ready
- Date published
- 2024-12-31
- Updated at
- 2025-11-10 16:30:53 +0900
Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data
- Journal article
- Creator
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;Atsushi Machida (author) (Search by this author)Kenji Nagata (author) (Search by this author)National Institute for Materials Science
;
Ryo Murakami (author) (Search by this author)National Institute for Materials Science
;
Hiroshi Shinotsuka (author) (Search by this author)National Institute for Materials Science
;
;Hayaru Shouno (author) (Search by this author)Hideki Yoshikawa (author) (Search by this author)National Institute for Materials Science
;
Masato Okada (author) (Search by this author)
- Keyword
- X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA
- Date published
- 2024-05-29
- Updated at
- 2025-11-10 12:30:27 +0900
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
- Journal article
- Creator
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Hiroshi Shinotsuka (author) (Search by this author)National Institute for Materials Science
;
Kenji Nagata (author) (Search by this author)National Institute for Materials Science
;
Hideki Yoshikawa (author) (Search by this author)National Institute for Materials Science
;
;Shuichi Ogawa (author) (Search by this author)Akitaka Yoshigoe (author) (Search by this author)
- Keyword
- Bayesian estimation, X-ray photoelectron spectroscopy, Statistical analysis, Silicon surface oxidation
- Date published
- 2024-12-03
- Updated at
- 2025-01-21 12:30:34 +0900
Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator
- Journal article
- Creator
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Hiroshi Shinotsuka (author) (Search by this author)Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
;
Kenji Nagata (author) (Search by this author)Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
;
;Malinda Siriwardana (author) (Search by this author)Research and Services Division of Materials Data and Integrated System, National Institute for Materials ScienceHideki Yoshikawa (author) (Search by this author)Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
;
Hayaru Shouno (author) (Search by this author)
https://orcid.org/0000-0002-2412-0184
(unauthenticated)
Graduate School of Informatics and Engineering, The University of Electro-Communications
;
Masato Okada (author) (Search by this author)
https://orcid.org/0000-0002-9040-8784
(unauthenticated)
Graduate School of Frontier Science, The University of Tokyo
- Keyword
- X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA
- Date published
- 2023-07-06
- Updated at
- 2024-01-05 22:11:57 +0900