Article Visualization of Micro-level Leak Position of Filters and Vacuum Seals

板倉 明子 SAMURAI ORCID (National Insutitute for Materials ScienceROR) ; 宮内 直弥 SAMURAI ORCID (National Institute for Materials ScienceROR) ; 北島 正弘 ; 矢ヶ部 太郎 SAMURAI ORCID (National Institute for Materials ScienceROR) ; 吉田 肇

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Citation
板倉 明子, 宮内 直弥, 北島 正弘, 矢ヶ部 太郎, 吉田 肇. Visualization of Micro-level Leak Position of Filters and Vacuum Seals. Vacuum and Surface Science. 2024, 67 (12), 20181383. https://doi.org/10.1380/vss.67.608

Description:

(abstract)

Operando hydrogen microscope (OHM) is an original hydrogen visualization equipment using electron stimulated desorption (ESD) method. In the equipment, permeated hydrogen atoms through the sample membrane are ionized by incident electron on the sample surface, desorbed into UHV environment and detected. By using the electron source of a scanning electron microscope (SEM) as the excitation source for ESD, we visualize the surface hydrogen distribution from the hydrogen desorption position. In the paper, we used OHM to visualize hydrogen leak position in standard conductance element (SCE), which is a filter of open type standard leak. As an example of measurement, we also identified the location of a leak in a sealing device.

Rights:

Keyword: Hydrogen, Visualization, micro leakage

Date published: 2024-12-10

Publisher: Surface Science Society Japan

Journal:

  • Vacuum and Surface Science (ISSN: 24335835) vol. 67 issue. 12 p. 608-614 20181383

Funding:

  • JSPS 18H03849

Manuscript type: Publisher's version (Version of record)

MDR DOI:

First published URL: https://doi.org/10.1380/vss.67.608

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Updated at: 2025-12-10 08:30:51 +0900

Published on MDR: 2025-12-10 08:23:54 +0900

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