Michinaka Sugano
(High Energy Accelerator Research Organization)
;
Akihiro Kikuchi
(National Institute for Materials Science)
;
Hitoshi Kitaguchi
(National Institute for Materials Science)
;
Gen Nishijima
(National Institute for Materials Science)
;
Tsuyoshi Yagai
(Sophia University)
説明:
(abstract)Mechanical properties of such ultra-thin Nb3Sn wires were evaluated to determine the cabling parameters and mechanical analysis of twisted cables. Tensile tests were performed at room temperature for 0.05 mm-thick Nb3Sn wires before and after heat treatment for the first time. Basic mechanical parameters such as
0.2% proof strength and fracture strength were evaluated from a stress–strain curve. Young’s modulus of such a thin wire was determined from unlading and reloading slopes of a load–stroke curve for the specimens with different gauge lengths. Fracture strain was estimated without using extensometers and strain gauges by correcting for machine deformation. Based on these results, we concluded that a simple technique to measure stress–strain curves for ultra-thin Nb3Sn wires was able to be established.
権利情報:
キーワード: Nb3Sn, tensile test, fracture strength, Young’s modulus
刊行年月日: 2023-03-21
出版者: Institute of Electrical and Electronics Engineers (IEEE)
掲載誌:
研究助成金:
原稿種別: 著者最終稿 (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.4366
公開URL: https://doi.org/10.1109/TASC.2023.3260070
関連資料:
その他の識別子:
連絡先: Akihiro Kikuchi (National Institute for Materials Science) KIKUCHI.Akihiro@nims.go.jp
更新時刻: 2024-01-30 09:38:10 +0900
MDRでの公開時刻: 2024-01-25 16:30:13 +0900
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ASC2022_Sugano_after_accepted_FINAL_VERSION.pdf
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サイズ | 43.9MB | 詳細 |