Michinaka Sugano
(High Energy Accelerator Research Organization)
;
Akihiro Kikuchi
(National Institute for Materials Science)
;
Hitoshi Kitaguchi
(National Institute for Materials Science)
;
Gen Nishijima
(National Institute for Materials Science)
;
Tsuyoshi Yagai
(Sophia University)
Description:
(abstract)Mechanical properties of such ultra-thin Nb3Sn wires were evaluated to determine the cabling parameters and mechanical analysis of twisted cables. Tensile tests were performed at room temperature for 0.05 mm-thick Nb3Sn wires before and after heat treatment for the first time. Basic mechanical parameters such as
0.2% proof strength and fracture strength were evaluated from a stress–strain curve. Young’s modulus of such a thin wire was determined from unlading and reloading slopes of a load–stroke curve for the specimens with different gauge lengths. Fracture strain was estimated without using extensometers and strain gauges by correcting for machine deformation. Based on these results, we concluded that a simple technique to measure stress–strain curves for ultra-thin Nb3Sn wires was able to be established.
Rights:
Keyword: Nb3Sn, tensile test, fracture strength, Young’s modulus
Date published: 2023-03-21
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Journal:
Funding:
Manuscript type: Author's version (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.4366
First published URL: https://doi.org/10.1109/TASC.2023.3260070
Related item:
Other identifier(s):
Contact agent: Akihiro Kikuchi (National Institute for Materials Science) KIKUCHI.Akihiro@nims.go.jp
Updated at: 2024-01-30 09:38:10 +0900
Published on MDR: 2024-01-25 16:30:13 +0900
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ASC2022_Sugano_after_accepted_FINAL_VERSION.pdf
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