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Raman spectroscopy is a precious tool for the characterization of van der Waals materials, e.g. for the determination of the layer number in thin exfoliated flakes. For sensitive materials, however, this method might turn out to be dramatically invasive. In particular, the light intensity required to obtain a significant Raman signal is sufficient to immediately photo-oxidize few-layer thick metallic van der Waals materials. In this work we investigated the impact of the environment on Raman characterization of thin NbSe2 crystals. We show that in ambient conditions the flake is locally oxidized even for very low illumination intensity. On the other hand, we observe no degradation if the Raman measurements are performed either in vacuum or on fully hBN-encapsulated samples. Interestingly, we find that covering the samples only from the top is not sufficient to prevent diffusion of oxygen within the layers.

権利情報:

• https://creativecommons.org/licenses/by/3.0/legalcode
  

キーワード: Raman spectroscopy, van der Waals materials, photo-oxidation

刊行年月日: 2020-01-01

出版者: IOP Publishing

掲載誌:

• 2D Materials (ISSN: 20531583) vol. 7 issue. 1 015012

研究助成金:

• Deutsche Forschungsgemeinschaft GRK1570

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1088/2053-1583/ab4723

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更新時刻: 2025-02-26 08:30:26 +0900

MDRでの公開時刻: 2025-02-26 08:30:26 +0900