Zhendong Wu
;
Yusuke Hayashi
(National Institute for Materials Science)
;
Tetsuya Tohei
;
Kazushi Sumitani
;
Yasuhiko Imai
;
Shigeru Kimura
;
Akira Sakai
Description:
(abstract)Nanobeam X-ray diffraction (nanoXRD) is a powerful tool for collecting in situ crystal structure information with high spatial resolution and data acquisition rate. However, analyzing the enormous amount of data produced by these high-throughput experiments for defect recognition or discovering hidden structural features becomes challenging. Machine learning (ML) methods have become attractive recently due to their outstanding performance in analyzing large data
sets. This research utilizes an ML algorithm, uniform manifold approximation and projection (UMAP), to enhance the nanoXRD-based crystal structure analysis of a cross-sectional hydride vapor-phase epitaxy GaN wafer.
Rights:
Keyword: GaN, SPring-8, nanoXRD, Machine learning
Date published: 2025-08-01
Publisher: International Union of Crystallography (IUCr)
Journal:
Funding:
Manuscript type: Publisher's version (Version of record)
MDR DOI:
First published URL: https://doi.org/10.1107/s1600576725004169
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Updated at: 2025-07-31 12:30:18 +0900
Published on MDR: 2025-07-31 12:16:53 +0900
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Wu 2025 J Appl Crystallogr nanoXRD UMAP HVPE GaN.pdf
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