Keigo Nakamura
;
Naoka Nagamura
(National Institute for Materials Science
)
;
Keiji Ueno
;
Takashi Taniguchi
(National Institute for Materials Science
)
;
Kenji Watanabe
(National Institute for Materials Science
)
;
Kosuke Nagashio
Description:
(abstract)Van der Waals heterostructure is the ideal material platform in the tunnel field effect transistors (TFET), because the band-to-band tunneling (BTBT) dominant current at the room temperature (RT) can be feasible due to the ideally dangling bond free heterointerface. However, the subthreshold swing (SS) lower than 60 mV/dec of the Boltzmann limit is still challenging. In this work, we systematically study the band alignment and heterointerface quality in the n-MoS2 channel heterostructure TFET. By selecting the p+-MoS2 source with the sufficiently high doping level, the stable gate modulation to type III band alignment was achieved regardless of the number of the MoS2 channel layers. For the gate stack formation, it is revealed that the top gate deposition of Al2O3 introduces the defect states for generation current at the reverse bias while the integration of h-BN top gate provides the defect-free clean interface, resulting in the BTBT dominant current even at RT. All 2D heterostructure TFET produced by combing the type III n-MoS2/p+-MoS2 heterostructure with h-BN top gate insulator, SS < 60 mV/dec was achieved at RT.
Rights:
Keyword: All 2D heterostructure devices, Band to band tunneling, Negative differential resistance, Subthreshold swing, Type III band alignment
Date published: 2020-11-18
Publisher: American Chemical Society (ACS)
Journal:
Funding:
Manuscript type: Author's version (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.5130
First published URL: https://doi.org/10.1021/acsami.0c13233
Related item:
Other identifier(s):
Contact agent:
Updated at: 2024-12-10 16:56:20 +0900
Published on MDR: 2024-12-10 16:56:20 +0900
| Filename | Size | |||
|---|---|---|---|---|
| Filename |
2012.01146v1(ACS2020).pdf
(Thumbnail)
application/pdf |
Size | 2.01 MB | Detail |