Takafumi Odani
;
Kenji Iso
;
Yuichi Oshima
;
Hirotaka Ikeda
;
Tae Mochizuki
;
Satoru Izumisawa
説明:
(abstract)High-resistive GaN has been studied for epitaxial substrate of lateral power devices. Fe-, C-, Mn- and Zn-doped GaNs were reported to exhibit high resistivity with the concentration of ~1 × 1018 cm−3. However, less impurites concentrations are more favorable for the growth of GaN monocrystal. Therefore, it is nescessary to search other dopants for GaN which realize high resistivity with the concentration of less than 1 × 1018 cm−3. This study shows that Ni-doped GaN monocrystals were grown on GaN substrates via HVPE using NiCl2 as the precursor for the first time. Two Ni-doped GaN substrates with Ni concentrations of 2.7 × 1017 cm−3 and 2.9 × 1018 cm−3 were obtained varying the partial pressure of NiCl2. The dependence of resistivities for the Ni-doped GaN on temperature were measured by the Hall effect method. Ni-doped GaN with the concentration of 2.7 × 1017 cm−3 exhibited higher resistivty than that with the concentration of 2.9 × 1018 cm−3. Using calculation with charge neutrality condition, the depth of Ni impurity in GaN was determined 1.4~1.5 eV, which indicated that the high resistivity of Ni-doped GaN was due to the deep acceptor of Ni.
権利情報:
キーワード: GaN HVPE
刊行年月日: 2024-03-11
出版者: Wiley
掲載誌:
研究助成金:
原稿種別: 著者最終稿 (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.4443
公開URL: https://doi.org/10.1002/pssb.202300584
関連資料:
その他の識別子:
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更新時刻: 2025-03-11 12:30:23 +0900
MDRでの公開時刻: 2025-03-11 12:30:24 +0900
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