Yosuke Sasama
;
Takuya Iwasaki
;
Masataka Imura
;
Kenji Watanabe
;
Takashi Taniguchi
;
Yamaguchi Takahide
説明:
(abstract)Hydrogen-terminated diamond field-effect transistors (FETs) using a hexagonal boron nitride (h-BN) gate insulator were fabricated on a diamond surface with reduced surface roughness in the direction of source/drain electrodes. The diamond surface was prepared on a mesa structure using chemical vapor deposition with a low methane concentration. The hydrogen-terminated surface was laminated with the h-BN gate insulator without air exposure to prevent the adsorption of atmospheric surface acceptors. The hydrogen-terminated diamond FET exhibited a high mobility of ≈1000 cm^2/(Vs) at room temperature. We performed theoretical analysis on the temperature and carrier density dependences of mobility, which suggested that Coulomb and surface roughness scattering were effectively reduced. The high mobility obtained in this study indicates the high potential of diamond as a semiconducting material. This study can contribute to the future development of diamond devices.
権利情報:
キーワード: diamond, field-effect transistors, hexagonal boron nitride
刊行年月日: 2025-10-06
出版者: AIP Publishing
掲載誌:
研究助成金:
原稿種別: 著者最終稿 (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.5802
公開URL: https://doi.org/10.1063/5.0272041
関連資料:
その他の識別子:
連絡先:
更新時刻: 2025-10-21 16:06:02 +0900
MDRでの公開時刻: 2025-10-21 15:43:26 +0900
| ファイル名 | サイズ | |||
|---|---|---|---|---|
| ファイル名 |
AcceptedManuscript_APL_2025_Sasama.pdf
(サムネイル)
application/pdf |
サイズ | 884KB | 詳細 |
| ファイル名 |
APL_2025_sasama_SupplementalInformation.pdf
application/pdf |
サイズ | 2.34MB | 詳細 |