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説明:

(abstract)

Optical constants of Mg(x)Zn(1-x)O films are measured by spectroscopic ellipsometry (M-2000U, J.A. Woollam Co.), where the Mg(x)Zn(1-x)O films are grown on Zn-polar ZnO (0001) substrates by molecular beam epitaxy. Ellipsometric parameters are measured at every 5 degrees of incidence from 50 to 70 degrees in the wavelength range of 193–1667 nm. The analysis employs a model combining the Tauc-Lorentz model and the Johs-Herzinger model, built in the Woollam WVASE32 software.

データの性質: experiment

権利情報:

• Creative Commons BY Attribution 4.0 International
  

キーワード: Optical constants, Spectroscopic ellipsometry, Zinc oxide

刊行年月日: 2025-04-06

出版者: NIMS

掲載誌:

研究助成金:

原稿種別: 論文以外のデータ

MDR DOI: https://doi.org/10.48505/nims.5313

公開URL: https://doi.org/10.1016/j.mtquan.2025.100036

関連資料:

その他の識別子:

連絡先: Yusuke Kozuka (Research Center for Materials Nanoarchitectonics, National Institute for Materials Science) KOZUKA.Yusuke@nims.go.jp

更新時刻: 2025-04-08 11:27:45 +0900

MDRでの公開時刻: 2025-03-05 08:30:10 +0900