XAFS spectrum of Nickel(II) oxide

Masashi Ishii; SAGA-LS

Dataset XAFS spectrum of Nickel(II) oxide

Masashi Ishii (National Institute for Materials Science) ; SAGA-LS (Kyushu Synchrotron Light Research Center)

Download all files (39.7 KB)

Collection

MDR XAFS DB

Citation

Masashi Ishii, SAGA-LS. XAFS spectrum of Nickel(II) oxide. https://doi.org/10.48505/nims.4179

(BibTeX)

Alternative title: O-K03

Description:

(abstract)

This dataset consists of X-ray absorption fine structure (XAFS) spectra at O K-edge of Nickel(II) oxide measured at SAGA SR BL12, and is a part of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection of MDR

Data origin type: experiment

Rights:

Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International

Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International

Keyword: Nickel(II) oxide, NiO, O K-edge, Oxide, BL12, SAGA-LS, XAFS, collection - MDR XAFS DB

Date published:

Publisher: Kyushu Synchrotron Light Research Center

Journal:

Funding:

Manuscript type: Not a journal article

MDR DOI: https://doi.org/10.48505/nims.4179

First published URL: https://www.saga-ls.jp/main/2026.html#gsc.tab=0

Related item:

Other identifier(s):

Contact agent: SAGA-LS (Kyushu Synchrotron Light Research Center)

Updated at: 2025-05-02 21:59:03 +0900

Published on MDR: 2023-06-08 22:08:48 +0900

Specimen / 試料

Name / 名称 : Nickel(II) oxide

Description / 試料の説明 : on carbon tape

Material type / 試料種別 : Oxide

Material type description / 試料種別の説明 : Oxide

Identifier / 識別子 :

Chemical composition / 試料の化学組成

Specimen ID / 試料ID :

Description / 化学組成の説明 :

Category / カテゴリ : Nickel(II) oxide

Category description / カテゴリの説明 :

Chemical composition ID / 組成ID :

Structural feature for specimen / 試料の構造的特徴

Specimen ID / 試料ID :

Description / 構造的特徴の説明 : Geometrical and electronic local structure around the absorption element

Category / カテゴリ : local structure

Category description / カテゴリの説明 : local structure

Instrument / 装置

Name / 装置の名称 : BL12_XAFS

Manufacturer / 装置製作者 : SAGA-LS

Model number / 型番 :

Description / 装置の説明 : SAGA-LS Beamline XAFS setup

Function / 機能 :

Function description / 機能の説明 : x-ray absorption spectroscopy

Instrument ID / 装置ID :

Instrument operator / 装置操作者 :

Instrument managing organization / 装置管理組織 : SAGA-LS, Kyushu Synchrotron Light Research Center

Measurement method / 計測法

Description / 説明 : total electron yield

Category / カテゴリ : x-ray absorption spectroscopy

Category description / カテゴリの説明 : x-ray absorption spectroscopy

Analysis field / 解析分野 : spectroscopy

Analysis field description / 解析分野の説明 : spectroscopy

Measurement environment / 計測環境 :

Standarized procedure / 標準手順 :

Measured at / 計測時刻 :

Energy level/Transition state / エネルギー準位・遷移状態

Category / カテゴリ : O K-edge

Category description / カテゴリの説明 :

Description / エネルギー準位の説明 : O K-edge

primary.tsv

key	value

Filename	Size
Filename	NiO_O-K.tey application/octet-stream	Size	4.83 KB	Detail
Filename	metadata.yml application/octet-stream	Size	1.58 KB	Detail
Filename	metadata.json application/json	Size	2.86 KB	Detail
Filename	primary.tsv text/tab-separated-values	Size	2.05 KB	Detail
Filename	NiO.Thumb.png (Thumbnail) image/png	Size	68.3 KB	Detail