Meiyong Liao
;
Huanying Sun
;
Satoshi Koizumi
説明:
(abstract)Here, electronic-grade phosphorus-doped n-type diamond epilayer with anatomically flat surface based on step-flow nucleation mode is fabricated. Consequently, n-channel diamond MOSFETs are demonstrated. The n-type diamond MOSFETs exhibit a high field-effect mobility around150 cm2 /V-sec at 573 K, which is the highest among all the n-channel MOSFETs based on wide-bandgap semiconductors. This work enables the development of energy-efficient and high-reliability CMOS integrated circuits for high-power electronics, integrated spintronics, and extreme sensors under harsh environments.
権利情報:
キーワード: Diamond, n-type, MOSFET
刊行年月日: 2024-01-19
出版者: Wiley
掲載誌:
研究助成金:
原稿種別: 出版者版 (Version of record)
MDR DOI:
公開URL: https://doi.org/10.1002/advs.202306013
関連資料:
その他の識別子:
連絡先:
更新時刻: 2024-04-09 16:30:23 +0900
MDRでの公開時刻: 2024-04-09 16:30:23 +0900
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Advanced Science - 2024 - Liao - High‐Temperature and High‐Electron Mobility Metal‐Oxide‐Semiconductor Field‐Effect.pdf
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サイズ | 1.94MB | 詳細 |