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説明:

X-ray detection is critical for numerous modern applications, including medical diagnosis, industrial inspection, security checks, scientific inquiry, and space exploration. Recent advances in materials science, electronics, manufacturing, and artificial intelligence have greatly propelled this field forward. This review examines fundamental principles and recent breakthroughs in X-ray detection and imaging technologies, with a focus on the interplay between electrical engineering techniques and X-ray-responsive materials. Two primary approaches are highlighted: semiconductor-based direct detection and scintillator-based indirect detection. These discussions encompass innovations such as photon counting detectors and heterojunction phototransistors. A key emphasis lies in elucidating the critical contributions of electrical engineering in the development of these cutting-edge detectors. This involves considerations such as chemical engineering, circuit optimization, and the implementation of image processing algorithms. Subsequent sections provide an overview of significant applications, ranging from biomedical imaging to resonant X-ray techniques for material analysis, and even nanometer-resolution circuit imaging. This review also underscores future research directions, which encompass 3D and 4D X-ray imaging sensors, multispectral X-ray imaging and artificial intelligence-assisted medical image diagnosis.

権利情報:

• In Copyright
  

  This version of the article has been accepted for publication, after peer review (when applicable) and is subject to Springer Nature’s AM terms of use, but is not the Version of Record and does not reflect post-acceptance improvements, or any corrections. The Version of Record is available online at: https://doi.org/10.1038/s44287-024-00086-x

キーワード: Optical materials

刊行年月日: 2024-08-22

出版者: Springer Science and Business Media LLC

掲載誌:

• Nature Reviews Electrical Engineering (ISSN: 29481201) vol. 1 issue. 10 p. 639-655

研究助成金:

原稿種別: 著者最終稿 (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.4863

公開URL: https://doi.org/10.1038/s44287-024-00086-x

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更新時刻: 2025-02-23 22:51:35 +0900

MDRでの公開時刻: 2025-02-23 22:51:35 +0900