Abigail J. Graham
;
Heonjoon Park
;
Paul V. Nguyen
;
James Nunn
;
Viktor Kandyba
;
Mattia Cattelan
;
Alessio Giampietri
;
Alexei Barinov
;
Kenji Watanabe
(National Institute for Materials Science)
;
Takashi Taniguchi
(National Institute for Materials Science)
;
Anton Andreev
;
Mark Rudner
;
Xiaodong Xu
;
Neil R. Wilson
;
David H. Cobden
Description:
(abstract)Stacking monolayer semiconductors creates moiré patterns, leading to correlated and topological electronic phenomena, but measurements of the electronic structure underpinning these phenomena are scarce. Here, we investigate the properties of the conduction band in moiré heterobilayers of WS2/WSe2 using submicrometer angle-resolved photoemission spectroscopy with electrostatic gating. We find that at all twist angles the conduction band edge is the K-point valley of the WS2, with a band gap of 1.58 ± 0.03 eV. From the resolved conduction band dispersion, we deduce an effective mass of 0.15 ± 0.02 me. Additionally, we observe replicas of the conduction band displaced by reciprocal lattice vectors of the moiré superlattice. We argue that the replicas result from the moiré potential modifying the conduction band states rather than final-state diffraction. Interestingly, the replicas display an intensity pattern with reduced 3-fold symmetry, which we show implicates the pseudo vector potential associated with in-plane strain in moiré band formation.
Rights:
This document is the Accepted Manuscript version of a Published Work that appeared in final form in Nano Letters, copyright © 2024 American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://doi.org/10.1021/acs.nanolett.3c04866.
Keyword: Two-Dimensional Materials, Two-Dimensional Heterostructures, Two-Dimensional Semiconductors, Angle-Resolved Photoemission Spectroscopy
Date published: 2024-05-01
Publisher: American Chemical Society (ACS)
Journal:
Funding:
Manuscript type: Author's version (Accepted manuscript)
MDR DOI:
First published URL: https://doi.org/10.1021/acs.nanolett.3c04866
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Updated at: 2025-07-28 12:30:20 +0900
Published on MDR: 2025-07-28 12:17:08 +0900
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2024A00491G_Cobden Nano Lett.pdf
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2024A00491G_Cobden Nano Lett SI.pdf
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