Ridwan P. Putra
(National Institute for Materials Science)
;
Kyosuke Matsushita
(National Institute for Materials Science)
;
Tsuyoshi Ohnishi
(National Institute for Materials Science)
;
Takuya Masuda
(National Institute for Materials Science)
説明:
(abstract)An operando bimodal atomic force microscopy system was constructed to perform nanomechanical mapping of an amorphous Si thin film electrode deposited on a Li6.6La3Zr1.6Ta0.4O12 solid electrolyte sheet during electrochemical lithiation/delithiation. The evolution of Young’s modulus maps of the Si electrode was successfully tracked as a function of apparent Li content x in lithium silicide (LixSi) simultaneously with real-time surface topography observation. At the initial stage of lithiation, the average modulus steeply decreased due to the generation of LixSi from intrinsic Si, followed by a moderate modulus reduction until the electrode capacity reached 3300 mAh g–1 (Li content x = 3.46). In the following delithiation, the gradual recovery of the average modulus of LixSi was observed up to 1467 mAh g–1 (Li content x = 1.54) at which delithiation stopped due to the significant volume change induced by phase transformation of LixSi.
権利情報:
キーワード: Atomic force microscopy (AFM), all-solid-state lithium ion batteries, operando/in situ, nanomechanical mapping
刊行年月日: 2024-01-18
出版者: American Chemical Society (ACS)
掲載誌:
研究助成金:
原稿種別: 出版者版 (Version of record)
MDR DOI:
公開URL: https://doi.org/10.1021/acs.jpclett.3c03012
関連資料:
その他の識別子:
連絡先:
更新時刻: 2024-08-27 08:30:20 +0900
MDRでの公開時刻: 2024-08-27 08:30:20 +0900
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putra-et-al-2024-operando-nanomechanical-mapping-of-amorphous-silicon-thin-film-electrodes-in-all-solid-state-lithium.pdf
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サイズ | 8.47MB | 詳細 |