Journal article Nanoscale Thermal Transport in Bi 2 (Te, Se) 3 Thermoelectric Material Using Pulsed STEM
Hyunyong Cho (author) (Search by this author)
ORCID https://orcid.org/0009-0006-3873-1177 (unauthenticated)
National Institute for Materials Science
ORCID ;
Hieu Duy Nguyen (author) (Search by this author)
;
Isamu Yamada (author) (Search by this author)
;
Koji Kimoto (author) (Search by this author)
ORCID https://orcid.org/0000-0002-3927-0492
National Institute for Materials Science
SAMURAI NIMS Researchers Directory SAMURAI
ORCID SAMURAI ;
Takao Mori (author) (Search by this author)
ORCID https://orcid.org/0000-0003-2682-1846
National Institute for Materials Science
SAMURAI NIMS Researchers Directory SAMURAI
ORCID SAMURAI ;
Naoyuki Kawamoto (author) (Search by this author)
ORCID https://orcid.org/0000-0002-2022-3987
National Institute for Materials Science
SAMURAI NIMS Researchers Directory SAMURAI
ORCID SAMURAI
Advanced Physics Research - 2026 - Cho - Nanoscale Thermal Transport in Bi2 Te Se 3 Thermoelectric Material Using Pulsed (1).pdf
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Citation
Hyunyong Cho, Hieu Duy Nguyen, Isamu Yamada, Koji Kimoto, Takao Mori, Naoyuki Kawamoto. Nanoscale Thermal Transport in Bi 2 (Te, Se) 3 Thermoelectric Material Using Pulsed STEM. Advanced Physics Research. 2026, 5 (7), e00004. https://doi.org/10.1002/apxr.202600004

Description:

(abstract)

Understanding thermal transport properties at the nanoscale can provide strategies for efficiently managing heat or improvingenergy conversion efficiency in various applications. Furthermore, when thermal paths can be traced and imaged at the nanoscale,materials or electronic devices can be designed to minimize heat loss. The demand for these technologies continues to grow rapidly.Here, we demonstrate imaging of thermal propagation in thermoelectric material (Bi 2 (Te, Se) 3 ) using a spatially resolved techniquethat uses thermal waves induced by a pulsed convergent electron beam in a scanning transmission electron microscopy (STEM)mode at room temperature. The measurements with nanoscale clearly reveal the anisotropy inherent in Bi 2 (Te, Se) 3 by quantifyingthe relative values of phase delay at each irradiated position. Also, the thermal wave propagation is significantly sensitive to thedirections of the media, as if the heat carriers lose their memory of the vibration mode in each direction and switch to a newmode. Capturing various thermal properties, such as directional thermal pathways, from nanoscale imaging can provide a deeperunderstanding of how materials affect heat transport. This insight plays a vital role in designing materials for thermal managementand energy conversion devices.

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Keyword: STEM像, HAADF-STEM像, 温度波位相像, 温度波振幅像, EDS

Date published: 2026-05-25

Publisher: Wiley

Journal:

  • Advanced Physics Research (ISSN: 27511200) vol. 5 issue. 7 e00004

Funding:

  • Ministry of Education, Culture, Sports, Science and Technology JPMXP1224NM5382
  • Precursory Research for Embryonic Science and Technology JPMJPR24J4
  • JST-Mirai Program JPMJMI19A1

Manuscript type: Publisher's version (Version of record)

MDR DOI:

First published URL: https://doi.org/10.1002/apxr.202600004

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Updated at: 2026-08-03 11:57:30 +0900

Published on MDR: 2026-08-03 14:30:26 +0900

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