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説明:

Understanding thermal transport properties at the nanoscale can provide strategies for efficiently managing heat or improvingenergy conversion efficiency in various applications. Furthermore, when thermal paths can be traced and imaged at the nanoscale,materials or electronic devices can be designed to minimize heat loss. The demand for these technologies continues to grow rapidly.Here, we demonstrate imaging of thermal propagation in thermoelectric material (Bi 2 (Te, Se) 3 ) using a spatially resolved techniquethat uses thermal waves induced by a pulsed convergent electron beam in a scanning transmission electron microscopy (STEM)mode at room temperature. The measurements with nanoscale clearly reveal the anisotropy inherent in Bi 2 (Te, Se) 3 by quantifyingthe relative values of phase delay at each irradiated position. Also, the thermal wave propagation is significantly sensitive to thedirections of the media, as if the heat carriers lose their memory of the vibration mode in each direction and switch to a newmode. Capturing various thermal properties, such as directional thermal pathways, from nanoscale imaging can provide a deeperunderstanding of how materials affect heat transport. This insight plays a vital role in designing materials for thermal managementand energy conversion devices.

権利情報:

• Creative Commons BY Attribution 4.0 International
  

キーワード: STEM像, HAADF-STEM像, 温度波位相像, 温度波振幅像, EDS

刊行年月日: 2026-05-25

出版者: Wiley

掲載誌:

• Advanced Physics Research (ISSN: 27511200) vol. 5 issue. 7 e00004

研究助成金:

• Ministry of Education, Culture, Sports, Science and Technology JPMXP1224NM5382
• Precursory Research for Embryonic Science and Technology JPMJPR24J4
• JST-Mirai Program JPMJMI19A1

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1002/apxr.202600004

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更新時刻: 2026-08-03 11:57:30 +0900

MDRでの公開時刻: 2026-08-03 14:30:26 +0900