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説明:

The cutting-edge thin film studies using the multiple-angle incidence resolution spectrometry (MAIRS) are introduced from the principle to forefront applications in a wide variety of research fields covering semiconductor material with respect to nanoarchitectonics. In this review, in addition, another application for physics purposes is also introduced where phonon in thin films is discriminated from normal infrared absorption bands by using the MAIRS technique.

権利情報:

• In Copyright
  © 2024 The Japan Society of Applied Physics
  This is an author-created, un-copyedited version of an article accepted for publication/published in Japanese Journal of Applied Physics. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at https://doi.org/10.35848/1347-4065/ad4ad8.

キーワード: MAIRS, nanoarchitectonics, IR, spectrometry

刊行年月日: 2024-06-03

出版者: IOP Publishing

掲載誌:

• Japanese Journal of Applied Physics (ISSN: 00214922) vol. 63 issue. 6 p. 60102-

研究助成金:

• Asahi Glass Foundation
• Japan Society for the Promotion of Science Grant-in-Aid Challenges in Research (Exploratory)

原稿種別: 著者最終稿 (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.4545

公開URL: https://doi.org/10.35848/1347-4065/ad4ad8

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更新時刻: 2025-05-13 08:30:12 +0900

MDRでの公開時刻: 2025-05-13 08:19:27 +0900