Article Probing of Polarization Reversal in Ferroelectric (Al,Sc)N Films Using Single‐ and Tri‐Layered Structures With Different Sc/(Al+Sc) Ratio

Shinnosuke Yasuoka ; Takao Shimizu SAMURAI ORCID (National Institute for Materials Science) ; Kazuki Okamoto ; Nana Sun ; Soshun Doko ; Naoko Matsui ; Toshikazu Irisawa ; Koji Tsunekawa ; Alexei Gruverman ; Hiroshi Funakubo

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Shinnosuke Yasuoka, Takao Shimizu, Kazuki Okamoto, Nana Sun, Soshun Doko, Naoko Matsui, Toshikazu Irisawa, Koji Tsunekawa, Alexei Gruverman, Hiroshi Funakubo. Probing of Polarization Reversal in Ferroelectric (Al,Sc)N Films Using Single‐ and Tri‐Layered Structures With Different Sc/(Al+Sc) Ratio. Advanced Materials Interfaces. 2024, 12 (5), 2400627. https://doi.org/10.1002/admi.202400627

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(abstract)

Probing of Polarization Reversal in Ferroelectric (Al, Sc) N Films Using Single‐and Tri‐Layered Structures With Different Sc/(Al+ Sc) Ratio

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Keyword: Ferroelectric, (Al,Sc)N Films, Wurtzite

Date published: 2024-10-13

Publisher: Wiley

Journal:

  • Advanced Materials Interfaces (ISSN: 21967350) vol. 12 issue. 5 2400627

Funding:

  • Japan Society for the Promotion of Science 21H01617
  • Japan Society for the Promotion of Science 22K18307
  • Japan Society for the Promotion of Science 22K20427

Manuscript type: Publisher's version (Version of record)

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First published URL: https://doi.org/10.1002/admi.202400627

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Updated at: 2025-12-18 16:26:41 +0900

Published on MDR: 2025-12-19 14:11:45 +0900

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