論文 Probing of Polarization Reversal in Ferroelectric (Al,Sc)N Films Using Single‐ and Tri‐Layered Structures With Different Sc/(Al+Sc) Ratio

Shinnosuke Yasuoka ; Takao Shimizu SAMURAI ORCID (National Institute for Materials Science) ; Kazuki Okamoto ; Nana Sun ; Soshun Doko ; Naoko Matsui ; Toshikazu Irisawa ; Koji Tsunekawa ; Alexei Gruverman ; Hiroshi Funakubo

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Shinnosuke Yasuoka, Takao Shimizu, Kazuki Okamoto, Nana Sun, Soshun Doko, Naoko Matsui, Toshikazu Irisawa, Koji Tsunekawa, Alexei Gruverman, Hiroshi Funakubo. Probing of Polarization Reversal in Ferroelectric (Al,Sc)N Films Using Single‐ and Tri‐Layered Structures With Different Sc/(Al+Sc) Ratio. Advanced Materials Interfaces. 2024, 12 (5), 2400627. https://doi.org/10.1002/admi.202400627

説明:

(abstract)

Probing of Polarization Reversal in Ferroelectric (Al, Sc) N Films Using Single‐and Tri‐Layered Structures With Different Sc/(Al+ Sc) Ratio

権利情報:

キーワード: Ferroelectric, (Al,Sc)N Films, Wurtzite

刊行年月日: 2024-10-13

出版者: Wiley

掲載誌:

  • Advanced Materials Interfaces (ISSN: 21967350) vol. 12 issue. 5 2400627

研究助成金:

  • Japan Society for the Promotion of Science 21H01617
  • Japan Society for the Promotion of Science 22K18307
  • Japan Society for the Promotion of Science 22K20427

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1002/admi.202400627

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更新時刻: 2025-12-18 16:26:41 +0900

MDRでの公開時刻: 2025-12-19 14:11:45 +0900

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