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Electron probe micro analyzer is used for the composition analysis of a wide variety of materials, and its quantification is almost established as a ZAF method. The quantification of MgGe alloy, however, showed an anomalously-high total concentration (ie.120%) of the elements of Mg and Ge. The present analysis of MgGe alloy was not considered to be correct according to the additional fact that the estimating concentration of Mg increase as the increase of accelerating voltage of the electron beam. Because the mass absorption coefficient of Ge for MgKa, is an essential parameter of the ZAF method, we then determined the mass absorption coefficient of Ge for MgKa by using measured X-ray peak intensity ratios of Ge and Mg of MgGe alloy to the standard materials (MgO and Ge). The resulting mass absorption coefficient of Ge for MgKa was 5561±200 cm2/g which were obtained between the electron-beam accelerating voltage of 15kV ～and 30kV. It is smaller than the previous mass absorption coefficient of 7510 cm2/g, which lead the anomalous quantification error. The difference of the mass absorption coefficients must be caused by the difficulty of the measurement of the mass absorption coefficient of Ge for MgKa energy of which is close to the Ge LⅠand LⅡabsorption edges.

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• Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
  

  Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International

キーワード: Mg-Ge alloy, electron probe microanalyzer, ZAF, mass absorption coefficient

刊行年月日: 2017-10-05

出版者: Surface Analysis Society of Japan

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原稿種別: 論文以外のデータ

MDR DOI:

公開URL: https://doi.org/10.1384/jsa.23.149

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更新時刻: 2024-06-21 19:04:42 +0900

MDRでの公開時刻: 2021-08-14 03:56:51 +0900