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Description:

Excitons, quasiparticles formed by the binding of an electron and a hole through electrostatic attraction, hold promise in the fields of quantum light confine- ment and optoelectronic sensing. Atomically thin transition metal dichalco- genides (TMDs) provide a highly versatile platform for hosting and manipu- lating excitons, given their robust Coulomb interactions and exceptional sen- sitivity to dielectric environments. In this study, we present a photoelectrical sensing technique, termed optically coupled microwave impedance microscopy (OC-MIM). OC-MIM enables the sensitive probing of exciton polarons and their Rydberg states at the nanoscale, unveiling their potential as localized quantum sensors. By utilizing this technique, we explore the interplay between excitons and material properties at the nanoscale, including carrier density, in- plane electric field, and dielectric screening. Furthermore, we employ a neural network algorithm to enable automated data analysis and quantitative extrac- tion of nanoscale electrical information. Our findings establish an invaluable sensing platform and readout mechanism, enhancing the understanding of ex- citon excitations and their applications in the quantum realm.

Rights:

• Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
  

Keyword: microwave sensing
, excitons
, TMDs

Date published: 2025-10-17

Publisher: Springer Science and Business Media LLC

Journal:

• Nature Communications (ISSN: 20411723) vol. 16 issue. 1 9236

Funding:

• Gordon and Betty Moore Foundation GBMF4546
• National Science Foundation NSF-DMR-2103910

Manuscript type: Publisher's version (Version of record)

MDR DOI:

First published URL: https://doi.org/10.1038/s41467-025-64280-7

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Updated at: 2026-03-10 12:30:21 +0900

Published on MDR: 2026-03-10 09:03:19 +0900