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説明:

Excitons, quasiparticles formed by the binding of an electron and a hole through electrostatic attraction, hold promise in the fields of quantum light confine- ment and optoelectronic sensing. Atomically thin transition metal dichalco- genides (TMDs) provide a highly versatile platform for hosting and manipu- lating excitons, given their robust Coulomb interactions and exceptional sen- sitivity to dielectric environments. In this study, we present a photoelectrical sensing technique, termed optically coupled microwave impedance microscopy (OC-MIM). OC-MIM enables the sensitive probing of exciton polarons and their Rydberg states at the nanoscale, unveiling their potential as localized quantum sensors. By utilizing this technique, we explore the interplay between excitons and material properties at the nanoscale, including carrier density, in- plane electric field, and dielectric screening. Furthermore, we employ a neural network algorithm to enable automated data analysis and quantitative extrac- tion of nanoscale electrical information. Our findings establish an invaluable sensing platform and readout mechanism, enhancing the understanding of ex- citon excitations and their applications in the quantum realm.

権利情報:

• Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
  

キーワード: microwave sensing
, excitons
, TMDs

刊行年月日: 2025-10-17

出版者: Springer Science and Business Media LLC

掲載誌:

• Nature Communications (ISSN: 20411723) vol. 16 issue. 1 9236

研究助成金:

• Gordon and Betty Moore Foundation GBMF4546
• National Science Foundation NSF-DMR-2103910

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1038/s41467-025-64280-7

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更新時刻: 2026-03-09 09:55:15 +0900

MDRでの公開時刻: 2026-03-10 09:03:19 +0900