J. Tang
;
M. T. Wei
;
A. Sharma
;
E. G. Arnault
;
A. Seredinski
;
Y. Mehta
;
K. Watanabe
(National Institute for Materials Science)
;
T. Taniguchi
(National Institute for Materials Science)
;
F. Amet
;
I. Borzenets
Collection
Citation
Description:
(abstract)We investigate the zero-bias behavior of Josephson junctions made of encapsulated graphene boron nitride heterostructures in the long ballistic junction regime. For temperatures down to 2.7K, the junctions appear non-hysteretic with respect to the switching and retrapping currents IC and IR. A small non-zero resistance is observed even around zero bias current, and scales with temperature as dictated by the phase diffusion mechanism. By varying the graphene carrier concentration we are able to confirm that the observed phase diffusion mechanism follows the trend for an overdamped Josephson junction. This is in contrast with the majority of graphene-based junctions which are underdamped and shorted by the environment at high frequencies.
Rights:
Keyword: Josephson junctions, graphene, phase diffusion
Date published: 2022-06-10
Publisher: American Physical Society (APS)
Journal:
- Physical Review Research (ISSN: 26431564) vol. 4 issue. 2 023203
Funding:
- Texas A and M University
- Division of Materials Sciences and Engineering
- Basic Energy Sciences DE-SC0002765
Manuscript type: Publisher's version (Version of record)
MDR DOI:
First published URL: https://doi.org/10.1103/physrevresearch.4.023203
Related item:
Other identifier(s):
Contact agent:
Updated at: 2025-02-28 08:31:25 +0900
Published on MDR: 2025-02-28 08:31:25 +0900
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