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A possible TOF-SIMS analysis of surface phase transitions has recently been proposed for limited cases such as polymers and ionic liquids. In the present study, we have extended this analysis to quench condensed noble gas films. The newly developed cryogenic TOF-SIMS allowed both measurements of TOF-SIMS below 4 K and low-energy ion scattering spectroscopy that is used to prepare a clean surface. It was found that the TOF-SIMS intensity variation by increasing the temperature at a constant ramp rate (temperature-programmed TOF-SIMS) shows steep changes due to sublimation. Thus, the possibility of analyzing the surface phase transition at the local region defined by the incident ion beam of (cryogenic) TOF-SIMS was demonstrated in the present study.

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  This is the peer reviewed version of the following article: Suzuki, T. (2025), Cryogenic TOF-SIMS Around Sublimation Temperature of Quench-Condensed Noble Gas (Ne, Ar, and Kr) Films. J Mass Spectrom, 60: e5107, which has been published in final form at https://doi.org/10.1002/jms.5107. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions. This article may not be enhanced, enriched or otherwise transformed into a derivative work, without express permission from Wiley or by statutory rights under applicable legislation. Copyright notices must not be removed, obscured or modified. The article must be linked to Wiley’s version of record on Wiley Online Library and any embedding, framing or otherwise making available the article or pages thereof by third parties from platforms, services and websites other than Wiley Online Library must be prohibited.

Keyword: cryogenic TOF-SIMS, noble gases

Date published: 2024-12-22

Publisher: Wiley

Journal:

• Journal of Mass Spectrometry (ISSN: 10765174) vol. 60 issue. 1

Funding:

• Japan Society for the Promotion of Science 15K13366

Manuscript type: Author's version (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.5212

First published URL: https://doi.org/10.1002/jms.5107

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Updated at: 2024-12-24 10:10:01 +0900

Published on MDR: 2025-12-22 08:22:09 +0900