論文 Cryogenic TOF‐SIMS Around Sublimation Temperature of Quench‐Condensed Noble Gas (Ne, Ar, and Kr) Films

Taku T. Suzuki SAMURAI ORCID

コレクション

引用
Taku T. Suzuki. Cryogenic TOF‐SIMS Around Sublimation Temperature of Quench‐Condensed Noble Gas (Ne, Ar, and Kr) Films. Journal of Mass Spectrometry. 2024, 60 (1), . https://doi.org/10.1002/jms.5107

説明:

(abstract)

A possible TOF-SIMS analysis of surface phase transitions has recently been proposed for limited cases such as polymers and ionic liquids. In the present study, we have extended this analysis to quench condensed noble gas films. The newly developed cryogenic TOF-SIMS allowed both measurements of TOF-SIMS below 4 K and low-energy ion scattering spectroscopy that is used to prepare a clean surface. It was found that the TOF-SIMS intensity variation by increasing the temperature at a constant ramp rate (temperature-programmed TOF-SIMS) shows steep changes due to sublimation. Thus, the possibility of analyzing the surface phase transition at the local region defined by the incident ion beam of (cryogenic) TOF-SIMS was demonstrated in the present study.

権利情報:

  • In Copyright
    This is the peer reviewed version of the following article: Suzuki, T. (2025), Cryogenic TOF-SIMS Around Sublimation Temperature of Quench-Condensed Noble Gas (Ne, Ar, and Kr) Films. J Mass Spectrom, 60: e5107, which has been published in final form at https://doi.org/10.1002/jms.5107. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions. This article may not be enhanced, enriched or otherwise transformed into a derivative work, without express permission from Wiley or by statutory rights under applicable legislation. Copyright notices must not be removed, obscured or modified. The article must be linked to Wiley’s version of record on Wiley Online Library and any embedding, framing or otherwise making available the article or pages thereof by third parties from platforms, services and websites other than Wiley Online Library must be prohibited.

キーワード: cryogenic TOF-SIMS, noble gases

刊行年月日: 2024-12-22

出版者: Wiley

掲載誌:

  • Journal of Mass Spectrometry (ISSN: 10765174) vol. 60 issue. 1

研究助成金:

  • Japan Society for the Promotion of Science 15K13366

原稿種別: 著者最終稿 (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.5212

公開URL: https://doi.org/10.1002/jms.5107

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更新時刻: 2024-12-24 10:10:01 +0900

MDRでの公開時刻: 2025-12-22 08:22:09 +0900

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